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Month: August 2015

Top-Down Integration Testing

An approach to integration testing where the component at the top of the component hierarchy is tested first, with lower-level components being simulated by stubs. Tested components are then used to test lower-level components. The process is repeated until the lowest level components have been tested.   In this approach, testing is conducted from the main module to the submodule. if the submodule is not developed a temporary program called STUB is used for simulating the submodule.   Advantages: * Advantageous if major flaws occur toward the top of the program. * Once the I/O functions are added, the representation Read More

Bottom Up Integration Testing

An approach to integration testing where the lowest level components are tested first then used to facilitate the testing of higher-level components. The process is repeated until the component at the top of the hierarchy is tested. In this approach, testing is conducted from the submodule to the main module, if the main module is not developed a temporary program called DRIVERS is used to simulate the main module. Advantages: * Advantageous if major flaws occur toward the bottom of the program. * Test conditions are easier to create. * Observation of test results is easier. Disadvantages: * Driver Modules Read More