Top-Down Integration Testing
An approach to integration testing where the component at the top of the component hierarchy is tested first, with lower-level components being simulated by stubs. Tested components are then used to test lower-level components. The process is repeated until the lowest level components have been tested.
In this approach, testing is conducted from the main module to the submodule. if the submodule is not developed a temporary program called STUB is used for simulating the submodule.
Advantages:
* Advantageous if major flaws occur toward the top of the program.
* Once the I/O functions are added, the representation of test cases is easier.
* Early skeletal Program allows demonstrations and boosts morale.
Disadvantages:
* Stub modules must be produced
* Stub Modules are often more complicated than they first appear to be.
* Before the I/O functions are added, the representation of test cases in stubs can be difficult.
* Test conditions may be impossible, or very difficult, to create.
* Observation of test output is more difficult.
* Allows one to think that design and testing can be overlapped.
* Induces one to defer completion of the testing of certain modules.
6 thoughts on “Top-Down Integration Testing”
Comments are closed.
Priligy 60 Mg Uk
does gabapentin make you sleepy
This really answered my problem, thank you!
There are some fascinating points in time on this article however I don抰 know if I see all of them heart to heart. There may be some validity however I will take hold opinion until I look into it further. Good article , thanks and we want extra! Added to FeedBurner as nicely
This really answered my downside, thank you!
After examine just a few of the weblog posts in your web site now, and I actually like your manner of blogging. I bookmarked it to my bookmark website record and will likely be checking again soon. Pls try my website as nicely and let me know what you think.